Study on Turn‑off Failure Mechanism of Large‑area IGCT

YAO Degui, DONG Manling, SONG Wei, ZHANG Jiatao, LU Yiwei, XIAO Chao, YANG Wuhua

RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2023, Vol. 43 ›› Issue (6) : 514-518.

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RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2023, Vol. 43 ›› Issue (6) : 514-518.
Device Physics & Device Simulation

Study on Turn‑off Failure Mechanism of Large‑area IGCT

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 43(6): 514-518

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