Regulation and Mechanism of Back Gate Bias on Buried Oxide Radiation-induced Trap Charge

WANG Haiyang, ZHENG Qiwen, CUI Jiangwei, LI Yudong, GUO qi

RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2022, Vol. 42 ›› Issue (6) : 449-455.

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RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2022, Vol. 42 ›› Issue (6) : 449-455.
Device Physics & Device Simulation

Regulation and Mechanism of Back Gate Bias on Buried Oxide Radiation-induced Trap Charge

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 42(6): 449-455

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