Ku-band T/R Chip Based on Two-gate-type GaN Integrated Process

KONG Lingzheng, PENG Longxin, TAO Hongqi, ZHANG Yibin, YAN Junda, WANG Weibo, HAN Fangbin

RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2022, Vol. 42 ›› Issue (6) : 429-434.

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PDF(1939 KB)
RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2022, Vol. 42 ›› Issue (6) : 429-434.
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Ku-band T/R Chip Based on Two-gate-type GaN Integrated Process

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 42(6): 429-434

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