A Sample-and-hold Circuit with BIFET Process

ZHOU Yuanjie, LUO Xun, HE Zhengrong, WANG Chenghe, FAN Guoliang, YANG Yang, XU Jiali

RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2022, Vol. 42 ›› Issue (4) : 317-322.

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RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2022, Vol. 42 ›› Issue (4) : 317-322.
Si Microelectronics

A Sample-and-hold Circuit with BIFET Process

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 42(4): 317-322

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