PDF(986 KB)
A Radiation Hardened Flip-flop with Interlaced Critical Nodes in 28 nm CMOS Technology
ZHOU Xinjie, ZHANG Lili, WANG Tao, GUO Gang, CHEN Qiming
RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2022, Vol. 42 ›› Issue (4) : 306-308.
PDF(986 KB)
PDF(986 KB)
A Radiation Hardened Flip-flop with Interlaced Critical Nodes in 28 nm CMOS Technology
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