PDF(695 KB)
Composite Double Exponential Current Source Model for Single Event Transient in 14 nm SOI FinFET
LIU Baojun, ZHANG Shuang, LI Chuang
RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2022, Vol. 42 ›› Issue (2) : 93-98.
PDF(695 KB)
PDF(695 KB)
Composite Double Exponential Current Source Model for Single Event Transient in 14 nm SOI FinFET
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