Study on Metal Defect Failure Localization of GaAs IC

LIU Liyuan, ZHENG Linting, SHI Gaoming, LIN Xiaoling, LAI Ping, CHEN Xuanlong

RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2022, Vol. 42 ›› Issue (2) : 146-149.

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RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2022, Vol. 42 ›› Issue (2) : 146-149.
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Study on Metal Defect Failure Localization of GaAs IC

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 42(2): 146-149

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