Investigation of XRD and Raman Spectroscopy of Mg2Si Thin Film Grown on Si(111) Substrate

LIAO Yangfang, XIE Quan

RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2021, Vol. 41 ›› Issue (5) : 376-381.

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RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2021, Vol. 41 ›› Issue (5) : 376-381.
Optoelectronics

Investigation of XRD and Raman Spectroscopy of Mg2Si Thin Film Grown on Si(111) Substrate

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2021, 41(5): 376-381

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