Investigations on Hot Carrier Injection and Total Ionizing Dose Effect of 22 nm Bulk FinFET

WANG Baoshun, CUI Jiangwei, ZHENG Qiwen, XI Shanxue, WEI Ying, LEI Qiqi, GUO Qi

RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2020, Vol. 40 ›› Issue (5) : 384-388.

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RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2020, Vol. 40 ›› Issue (5) : 384-388.
Material & Technologys

Investigations on Hot Carrier Injection and Total Ionizing Dose Effect of 22 nm Bulk FinFET

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2020, 40(5): 384-388

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