Study on the Application of DOE Method in ESD and LU Testing Failure Localization

LU Xiangbin, CHEN Yanning, ZHANG Haifeng, YUAN Yidong, ZHONG Mingchen, ZHANG Zhigang

RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2020, Vol. 40 ›› Issue (3) : 226-232.

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RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2020, Vol. 40 ›› Issue (3) : 226-232.
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Study on the Application of DOE Method in ESD and LU Testing Failure Localization

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2020, 40(3): 226-232

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