An Automated Three‑dimensional Test System for Millimeter Wave Double‑sided Wafer

YANG Jin, ZHANG Junzhi, ZHU Jian, HUANG Min, YU Yuanwei, YAN Fanyuhui, WANG Liubao

RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2025, Vol. 45 ›› Issue (1) : 10501.

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RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2025, Vol. 45 ›› Issue (1) : 10501. DOI: 10.12450/j.gtdzx.202501013

An Automated Three‑dimensional Test System for Millimeter Wave Double‑sided Wafer

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 45(1): 10501 https://doi.org/10.12450/j.gtdzx.202501013

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