Hot Carrier Degradation Analysis and Lifetime Prediction of LDD MOSFET

CHEN Guangqian, LIU Weijing, LIU Xianting, LI Qinghua

RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2024, Vol. 44 ›› Issue (4) : 351-356.

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RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2024, Vol. 44 ›› Issue (4) : 351-356. DOI: 10.12450/j.gtdzx.202404013
Device & Material & Technology

Hot Carrier Degradation Analysis and Lifetime Prediction of LDD MOSFET

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 44(4): 351-356 https://doi.org/10.12450/j.gtdzx.202404013

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