Study on the Circuit Simulation Technology on Integrated Circuit Failure Mechanism Analysis

Study on the Circuit Simulation Technology on Integrated Circuit Failure Mechanism Analysis

GONG Yu

RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2024, Vol. 44 ›› Issue (4) : 337-342.

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RESEARCH & PROGRESS OF SOLID STATE ELECTRONICS ›› 2024, Vol. 44 ›› Issue (4) : 337-342. DOI: 10.12450/j.gtdzx.202404011

Microelectronics & Microsystems

Study on the Circuit Simulation Technology on Integrated Circuit Failure Mechanism Analysis

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 44(4): 337-342 https://doi.org/10.12450/j.gtdzx.202404011

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