GaN收发多功能芯片在片集成测试优化
陈金远, 余旭明, 王逸铭, 丛诗力, 葛佳月, 戴一凡
Optimization of On‑wafer Integration Testing of GaN Transceiver Multifunctional Chips
CHEN Jinyuan, YU Xuming, WANG Yiming, CONG Shili, GE Jiayue, Dai Yifan
固体电子学研究与进展
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2024, (4): 315
-318
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DOI: 10.12450/j.gtdzx.202404007
