碳化硅MOSFET有源门极驱动的电压电流过冲快速检测电路设计

PDF(1181 KB)

固体电子学研究与进展 ›› 2025, Vol. 45 ›› Issue (2) : 0. DOI: 10.12450/j.gtdzx.202502003

作者信息 +

Design of Fast Detection Circuit for Voltage and Current Overshoot of Active Gate Drive of Silicon Carbide MOSFETs

Author information +

文章历史 +

导出引用

{{article.zuoZheCn_L}}. {{article.title_cn}}[J]. {{journal.qiKanMingCheng_CN}}, 2025, 45(2): 0 https://doi.org/10.12450/j.gtdzx.202502003

{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 45(2): 0 https://doi.org/10.12450/j.gtdzx.202502003

中图分类号：

原文顺序 | 文献年度倒序 | 文中引用次数倒序

PDF(1181 KB)

Accesses

Citation

Detail

段落导航